Assessment of crystal quality and unit cell orientation in epitaxial Cu2ZnSnSe4 layers using polarized Raman scattering

  • Autor:

    C. Krämmer, M. Lang, A. Redinger, J. Sachs, C. Gao, H. Kalt, S. Siebentritt, and M. Hetterich
  • Source:

    Opt. Express 22, 28240-28246 (2014)
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